There is little to no risk for soybean aphid damage or migration in the next five days.
There is little to no risk for western bean cutworm development in the next five days.
There is little to no risk for corn earworm migration in the next five days.
There is little to no risk for corn rootworm damage in the next five days.
Low black cutworm migration risks are predicted tomorrow night into Thursday mainly west of the Mississippi River, with the Low risk then shifting to …